The primary driver for advanced testing solutions is the physics of modern manufacturing. With the advent of FinFETs and gate-all-around transistors, new defect mechanisms have emerged that are invisible to older testing protocols. The challenges to quality include:
To appreciate testable design, one must first classify the types of tests. The primary driver for advanced testing solutions is
The Q-90's package was a 1,500-ball BGA. No physical probes. They'd use JTAG (IEEE 1149.1) boundary scan to shift test data in and out through the existing debug port. The silicon was already wired for it—the designer just forgot to use it for internal faults. The primary driver for advanced testing solutions is
AI is revolutionizing test quality. Neural networks can now: The primary driver for advanced testing solutions is